A Scanning Electron Microscope, with a large chamber to allow for the visualization of structural materials, is available for students, faculty, and staff of the university, as well as for external users who might have a need for microscopy.
Provided by an NSF MRI grant written by investigators from the College of Engineering and the College of Arts and Sciences, the state-of-the-art Scanning Electron Microscope can magnify up to 1,000,000x at a resolution of 3 nm, and also has a low-vacuum setting in order to image non-conductive samples. Additionally, the microscope will be available for remote operation, so that external users can image samples from their location.
- Scanning Electron Microscope
- Energy Dispersive X-ray spectrometer (EDX)
- Electron Backscatter Diffraction (EBSD)